AI—使用设计信息推动检测和诊断.pdf

1、Executive ConferenceArtificialArtificialIntelligenceIntelligenceexplore the power of AI to transform semiconductor design&manufacturingMichael Yu/Thomas ZanonMichael Yu/Thomas ZanonPDF SolutionsPresentationPresentationAI to Use Semiconductor Design Information to Drive Inspection and DiagnosticsMarc

2、 HutnerMarc HutnerSiemensThis presentation and discussions resulting from it may include future product features or fixes,or the expected timing of future releases.This information is intended only to highlight areas of possible future development and current prioritizations.Nothing in this presenta

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5、her trademarks cited in this document are the property of their respective owners.Exensio visualizations Powered by TIBCO.2024 PDF Solutions,Inc.or its subsidiaries.All rights reserved.Copyright PDF Solutions 2024BackgroundBackgroundOne of the challenges for AI/ML application for semiconductor is th

6、e need of large data One of the challenges for AI/ML application for semiconductor is the need of large data volume,while we could benefit from utilize the model at initial stage(where there is few volume,while we could benefit from utilize the model at initial stage(where there is few data)data)In