1、RELIABILITY REPORTPhase Seventeen TestingEPC POWER CONVERSION TECHNOLOGY LEADER|EPC-CO.COM|2025|For more information:infoepc-|1GaN Reliability and Lifetime Projections:Phase 17The rapid adoption of Gallium Nitride(GaN)devices in many diverse applications calls for continued accumulation of reliabili

2、ty statistics and research into the fundamental physics of failure in GaN devices,including integrated circuits(ICs).This Phase 17 Reliability Report presents ongoing efforts using test-to-fail methodology to develop more comprehensive and advanced lifetime models,which is aimed at accurately projec

3、ting the reliability of GaN devices under more complex mission-specific operating conditions.Siddhesh Gajare,Ph.D.,Duanhui Li,Ph.D.,Ricardo Garcia,Angel Espinoza,Jordan Green,Peter Tieu,Ph.D.,Christopher Wong,Anthony Nguyen,David Wu,Shengke Zhang,Ph.D.HERE ARE THE NEW ADDITIONS TO THE PHASE 17 RELIA

4、BILITY REPORTThe latest Phase 17 reliability report further expands the first-principles lifetime models to address more complex operating conditions,enabling more accurate lifetime projections for mission specific applications.Additionally,the latest version focuses on presenting the complex physic

5、s-based models in a variety of application-driven,user-friendly formats,allowing readers to quickly comprehend the concepts and apply them to practical use conditions with ease.Section 4.1 presents an expanded gate lifetime model which now incorporates the effect of gate leakage current under variou

6、s gate-source voltages and temperatures into the dominant impact ionization mechanism.Next,a duty cycle-based repetitive transient gate overvoltage rating at 7 V was developed and validated through the development of a repetitive inductive-switching gate overvoltage testing system,which accurately m